Determination of the extinction coefficient of dielectric thin films from spectrophotometric measurements
- 15 July 1989
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 28 (14) , 2895-2901
- https://doi.org/10.1364/ao.28.002895
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 8 references indexed in Scilit:
- Description of a scattering apparatus: application to the problems of characterization of opaque surfacesApplied Optics, 1989
- In situ and air index measurements: influence of the deposition parameters on the shift of TiO_2/SiO_2 Fabry-Perot filtersApplied Optics, 1986
- Ellipsometrische Bestimmung von Oberflächenschichten Auf Polierten Optischen GläsernOptica Acta: International Journal of Optics, 1983
- An improved method for the determination of the extinction coefficient of thin film materialsThin Solid Films, 1983
- Automatic determination of the optical constants of inhomogeneous thin filmsApplied Optics, 1982
- Scattering from multilayer thin films: theory and experimentJournal of the Optical Society of America, 1981
- Sensitive photothermal deflection technique for measuring absorption in optically thin mediaOptics Letters, 1980
- VI Methods for Determining Optical Parameters of Thin FilmsPublished by Elsevier ,1963