The size-induced metal-insulator transition and related electron interference phenomena in modern microelectronics
- 29 June 2007
- book chapter
- Published by Springer Nature
- p. 317-328
- https://doi.org/10.1007/bfb0108020
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Disordered Electronic SystemsPhysics Today, 1988
- The electron cut-off wavelength transistorApplied Physics A, 1988
- Quantized conductance of point contacts in a two-dimensional electron gasPhysical Review Letters, 1988
- Observation of discrete electronic states in a zero-dimensional semiconductor nanostructurePhysical Review Letters, 1988
- Size-induced metal-insulator transition in metals and semiconductorsJournal of Crystal Growth, 1988
- On electron confinement effects and the ultimate size reduction in semiconductor devicesSemiconductor Science and Technology, 1987
- Quantum-size affected conductivity of mesoscopic metal particlesPhysics Letters A, 1987
- Length-Independent Voltage Fluctuations in Small DevicesPhysical Review Letters, 1987
- The physics of quantum well structuresReports on Progress in Physics, 1985
- Electrons in disordered systems and the theory of localizationPhysics Reports, 1974