Channeling measurements methodology
- 1 June 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 74 (4) , 581-596
- https://doi.org/10.1016/0168-583x(93)95958-8
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Giant focusing peak and potential dependence observed in a transition from axial to planar channeling in SiNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- Simulation analysis of ion channeling spectra: thermal vibrational amplitude in SiNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1992
- High precision structural measurements on thin epitaxial layers by means of ion-channelingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1990
- Surface studies ofcompound semiconductors by ion channelingPhysical Review B, 1989
- Monte Carlo calculation of energy loss of channeled ionsPhysics Letters A, 1988
- Response of silicon detectors to 1H and 4He ionsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Nonlinear response of Si detectors for low-Z ionsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1986
- Channeling and related effects in the motion of charged particles through crystalsReviews of Modern Physics, 1974
- Axial- to Planar-Channeling TransitionPhysical Review B, 1973
- An experimental study of the orientation dependence of (p,γ) yields in monocrystalline aluminumNuclear Instruments and Methods, 1965