Transfer and treatment of AES, XPS and SIMS data with a network computer station
- 1 July 1988
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 12 (2) , 78-82
- https://doi.org/10.1002/sia.740120203
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Simultaneous AES and SIMS depth profiling of standard Ta2O5 filmsSurface and Interface Analysis, 1988
- The ultra-high resolution depth profiling reference material — Ta2O5 anodically grown on TaSurface Science, 1984
- The depth dependence of the depth resolution in composition–depth profiling with Auger Electron SpectroscopySurface and Interface Analysis, 1983
- Practical peak area measurements in X‐ray photoelectron spectroscopySurface and Interface Analysis, 1981
- Smoothing and differentiation of data by simplified least square procedureAnalytical Chemistry, 1972
- High-Resolution X-Ray Photoemission Spectrum of the Valence Bands of GoldPhysical Review B, 1972
- Smoothing and Differentiation of Data by Simplified Least Squares Procedures.Analytical Chemistry, 1964