A simple photoconductive frequency-resolved spectrometer for carrier lifetime determination in semiconductors
- 1 January 1988
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 21 (1) , 84-85
- https://doi.org/10.1088/0022-3735/21/1/015
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Photoconductivity measurements in a-Si:H by frequency-resolved spectroscopyJournal of Physics C: Solid State Physics, 1984
- Frequency-resolved spectroscopy and its application to the analysis of recombination in semiconductorsPhilosophical Magazine Part B, 1984
- Synthesis of silicon dioxide by ion implantationNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- A direct determination of the lifetime distribution of the 1.4 eV luminescence of a-Si:HJournal of Physics C: Solid State Physics, 1982
- Recombination in plasma-deposited amorphous Si:H. Luminescence decayPhysical Review B, 1979