Growth and characterization of ZnO films deposited on a monolithic Si3N4-SiO2-Si configuration
- 1 January 1989
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 168 (2) , 291-305
- https://doi.org/10.1016/0040-6090(89)90014-x
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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