Deep level transient spectroscopy of hole traps in Zn-annealed ZnTe
- 30 June 1983
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 46 (11) , 795-798
- https://doi.org/10.1016/0038-1098(83)90004-2
Abstract
No abstract availableKeywords
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