The effect of ion species on morphological structure development of ion bombarded (1131) single crystal Cu

This publication has 4 references indexed in Scilit:

• Ion bombardment induced surface topography modification of clean and contaminated single crystal Cu and Si
  Surface and Interface Analysis, 1982
• The effect of incidence angle on ion bombardment induced surface topography development on single crystal copper
  Nuclear Instruments and Methods in Physics Research, 1982
• The mechanisms of etch pit and ripple structure formation on ion bombarded Si and other amorphous solids
  Nuclear Instruments and Methods, 1980
• The production of regular pyramids on argon ion bombarded surfaces of copper crystals
  Applications of Surface Science, 1978