ESR line share study of amorphous centres in ion implanted silicon
- 16 December 1978
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 50 (2) , K209-K212
- https://doi.org/10.1002/pssa.2210500271
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Backscattering and ESR Studies in Heavily Damaged LayerPublished by Springer Nature ,1975
- Electron Spin Resonance in Amorphous Silicon, Germanium, and Silicon CarbidePhysical Review Letters, 1969
- Exchange Narrowing in Paramagnetic ResonanceReviews of Modern Physics, 1953