Statistical modeling for circuit simulation

This publication has 4 references indexed in Scilit:

• Comparison between matching parameters and fluctuations at the wafer level
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Statistical IC simulation based on independent wafer extracted process parameters and experimental designs
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Relating statistical MOSFET model parameter variabilities to IC manufacturing process fluctuations enabling realistic worst case design
  IEEE Transactions on Semiconductor Manufacturing, 1994
• Random errors in MOS capacitors
  IEEE Journal of Solid-State Circuits, 1982