Viscoelastic buckling and plastic flow?deterministic mechanisms for ripple initiation on ion-bombarded amorphous solids

This publication has 22 references indexed in Scilit:

• Roughening and ripple instabilities on ion-bombarded Si
  Physical Review B, 1996
• Influence of O+2 energy, flux, and fluence on the formation and growth of sputtering-induced ripple topography on silicon
  Journal of Vacuum Science & Technology A, 1996
• Ripple topography development on ion bombarded Si
  Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1996
• Directional Mass Transport by Momentum Transfer from Ion Beam to Solid
  Physical Review Letters, 1995
• The effects of ion species and target temperature on topography development on ion bombarded Si
  Journal of Applied Physics, 1995
• Ion-Beam-Induced Surface Instability of Glassy F${\mathrm{e}}_{40}$N${\mathrm{i}}_{40}$${\mathrm{B}}_{20}$
  Physical Review Letters, 1995
• Influence of the composition of the altered layer on the ripple formation
  Journal of Vacuum Science & Technology A, 1994
• Reproducibility and stability in surface morphological evolution
  Philosophical Magazine Part B, 1991
• Stress model for the wrinkling of ion-implanted layers
  Physical Review B, 1990
• The mechanisms of etch pit and ripple structure formation on ion bombarded Si and other amorphous solids
  Nuclear Instruments and Methods, 1980