Branching of Critical Conditions for Si(111)-() Oxidation
- 10 July 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 75 (2) , 272-275
- https://doi.org/10.1103/physrevlett.75.272
Abstract
From kinetic measurements by optical second harmonic generation of interaction with at temperatures between 610 and 735 °C and pressures from 1 to 1 torr, we determine the boundaries for oxide nucleation and for quasiequilibrium between surface phases of oxide and silicon. The distinction between these boundaries reflects the influence of the kinetic parameters of the surface reactions on the critical conditions. At , the oxide nucleation requires oxygen pressure well above that required for oxide growth.
Keywords
This publication has 20 references indexed in Scilit:
- High temperature scanning tunneling microscopy studies on the interaction of O2 with Si(111)-(7 × 7) surfacesSurface Science, 1994
- Mechanism of submonolayer oxide formation on silicon surfaces upon thermal oxidationPhysical Review B, 1994
- Elevated temperature oxidation and etching of the Si(111) 7×7 surface observed with scanning tunneling microscopyJournal of Vacuum Science & Technology A, 1993
- Ball-milling-induced amorphization incompounds: A parametric studyPhysical Review B, 1993
- Initial stages of the interaction of nitrous oxide and oxygen with the (100) silicon surface under low pressuresReactivity of Solids, 1989
- Reaction of Oxygen with Si(111) and (100): Critical Conditions for the Growth of SiO2Journal of the Electrochemical Society, 1982
- Silicon monoxide pressures due to the reaction between solid silicon and silicaThe Journal of Chemical Thermodynamics, 1974
- Kinetics and mechanism of low-pressure, high-temperature oxidation of silicon-IIOxidation of Metals, 1971
- Low Voltage Electron Diffraction Study of the Oxidation and Reduction of SiliconJournal of Applied Physics, 1962
- Passivity during the Oxidation of Silicon at Elevated TemperaturesJournal of Applied Physics, 1958