Determination of pore size distribution and surface area of thin porous silicon layers by spectroscopic ellipsometry
- 1 March 2001
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 172 (1-2) , 117-125
- https://doi.org/10.1016/s0169-4332(00)00847-3
Abstract
No abstract availableThis publication has 28 references indexed in Scilit:
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