Combinational ATPG theorems for identifying untestable faults in sequential circuits

This publication has 5 references indexed in Scilit:

• Test generation for synchronous sequential circuits using multiple observation times
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• A transitive closure algorithm for test generation
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1993
• On removing redundancy in sequential circuits
  Published by Association for Computing Machinery (ACM) ,1991
• Test generation for sequential circuits
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1988
• A Nine-Valued Circuit Model for Test Generation
  IEEE Transactions on Computers, 1976