Nitrogen isoelectronic trap in GaAs1xPx: II. Model calculation of the electronic states NΓ and NX at low temperature

Abstract
A semiphenomenological theory of the isolated N isoelectronic trap in GaAs1xPx is presented, based on an extended (multisite), one-band Koster-Slater model of the electron-impurity interaction, including the effects of both the central-cell atomic pseudopotential difference and the spatially extended lattice distortion surrounding the substitutional nitrogen impurity. The alloy host is treated in a virtual-crystal approximation. The parameters of the model are determined by fitting low-temperature photoluminescence data from ion-implanted materials of two compositions selected near x0.35. The model yields both a spatially localized NX (or A) state which evolves continuously with decreasing x from the A line of GaP, and a spatially-diffuse state NΓ which is present in near-direct and direct-band-gap alloys (0.3x0.5). The theory quantitatively describes the energies of these luminescence lines as a function of alloy composition x. In addition, good agreement with the data is found for the following calculated quantities: (i) the composition dependences of the NΓ and NX luminescence intensities, (ii) the pressure dependences of the NΓ and NX intensities, (iii) the composition dependence of the NX lifetime, and (iv) the binding energy of NN1 pairs in GaP. The model leads to a tentative interpretation of NΓ luminescence as originating, at least in part, from excitonic molecules.