Stimulated emission on Nx(’’A-line’’) recombination transitions in nitrogen-implanted GaAs1−xPx(x≈0.37)

Abstract
Stimulated emission (4.2 °K) on the NX band recombination transition (formerly identified as NN-pair band) in N-implanted GaAs1−xPx(x≈0.37) is reported. The N is implanted (300 °K) at 200 keV to a peak concentration nN∼5×1018 cm−3 (depth 3600 Å), and to remove damage the crystal is later annealed at 950 °C for 0.5 h. The laser operation observed is the first involving an implanted isoelectronic trap, and occurs on the NX band at higher alloy composition than for any previous case.