Flux flow in high-T c Josephson junctions

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Abstract
The possibility of achieving fluxon nucleation in nonhysteretic high‐Tc Josephson junctions due to the presence of inhomogeneities is investigated numerically. For a large range of parameters the I‐V characteristics in presence of such discontinuities show a strong similarity with those obtained experimentally. The spatial inhomogeneities considered are on the scale of the Josephson penetration depth (μm). It is demonstrated that the topic is of interest for the construction of amplifiers. Thus when fluxons are generated the resulting flux flow regime proves to be much more sensitive than the uniform solution to external fields.