Cross-sectional and high resolution TEM studies of structural phase transitions in MeV-ion-implanted InP crystals
- 30 June 1989
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 30 (1-2) , 242-248
- https://doi.org/10.1016/0304-3991(89)90192-7
Abstract
No abstract availableKeywords
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