Dielectric measurements on substrate materials at microwave frequencies using a cavity perturbation technique
- 1 April 1988
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 63 (7) , 2466-2468
- https://doi.org/10.1063/1.341024
Abstract
No abstract availableThis publication has 18 references indexed in Scilit:
- An uncertainty analysis for the measurement of microwave conductivity and dielectric constant by the short-circuited line methodIEEE Transactions on Instrumentation and Measurement, 1986
- Electrical properties of films at microwave frequenciesBulletin of Materials Science, 1984
- Measurement of Dielectric Parameters at Microwave Frequencies by Cavity-Perturbation TechniqueIEEE Transactions on Microwave Theory and Techniques, 1979
- Dielectric properties of multilayers of solids and liquids at microwave frequenciesJournal of Physics E: Scientific Instruments, 1978
- Microwave Measurement of Dielectric Constant of Liquids and Solids Using Partially Loaded Slotted Waveguide (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1974
- Determination of dielectric parameters for films at microwave frequenciesJournal of Applied Physics, 1973
- Dielectric Measurements of Sheet MaterialsIEEE Transactions on Instrumentation and Measurement, 1973
- Measurement of Microwave Dielectric Constants of Ferroelectrics Part I. Dielectric Constants of BaTiO3 Single Crystal at 3.3 KMc/sJournal of the Physics Society Japan, 1960
- Note on Cavity Perturbation TheoryJournal of Applied Physics, 1957
- A New Method for Measuring Dielectric Constant and Loss in the Range of Centimeter WavesJournal of Applied Physics, 1946