SnO films and their oxidation to SnO2: Raman scattering, IR reflectivity and X-ray diffraction studies
- 1 November 1984
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 121 (3) , 217-225
- https://doi.org/10.1016/0040-6090(84)90303-1
Abstract
No abstract availableKeywords
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