Aberrations and allowances for errors in a hemisphere solid immersion lens for submicron-resolution photoluminescence microscopy
- 1 May 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 85 (9) , 6923-6925
- https://doi.org/10.1063/1.370107
Abstract
We have analyzed the aberrations and allowances for an aspheric error, a thickness error, and an air gap in a hemisphere solid immersion lens for photoluminescence microscopy with submicron resolution beyond the diffraction limit, where light with large ray angle and the effect of an evanescent field play important roles.This publication has 9 references indexed in Scilit:
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