Enhancing random-pattern coverage of programmable logic arrays via masking technique
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 8 (9) , 1022-1025
- https://doi.org/10.1109/43.35555
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Random-Pattern Coverage Enhancement and Diagnosis for LSSD Logic Self-TestIBM Journal of Research and Development, 1983