Vacancy kinetics and sputtering of GaAs(110)
- 15 April 1995
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 51 (16) , 10929-10936
- https://doi.org/10.1103/physrevb.51.10929
Abstract
Bombardment of GaAs(110) at 300≤T≤775 K with ions at normal incidence creates surface-layer defects that generally span one or two unit cells, as shown by scanning tunneling microscopy. Vacancies produced in this way diffuse via thermal activation to form single-layer vacancy islands. The diffusion of divacancies favors [11¯0] and accommodation at islands produces roughly isotropic islands. Modeling of growth showed an overall Arrhenius behavior for diffusion with an activation energy of 1.3±0.2 eV. Investigations of the surface morphology during multilayer erosion revealed deviation from layer-by-layer removal with scaling exponents between 0.4 and 0.5 for 626≤T≤775 K.
Keywords
This publication has 23 references indexed in Scilit:
- Temperature-dependent surface morphologies for Br-etched Si(100)-2×1Physical Review B, 1994
- Study of ion bombardment induced vacancy islands on Au(100) by scanning tunneling microscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1994
- andadsorption and etching of GaAs(110) studied by use of scanning tunneling microscopyPhysical Review B, 1993
- Surface roughness in thin-film growth: The effect of mass transport between layersPhysical Review B, 1993
- Layer-by-layer etching of Si(100)-2×1 with: A scanning-tunneling-microscopy studyPhysical Review B, 1993
- Scanning-tunneling-microscope tip-induced migration of vacancies on GaP(110)Physical Review Letters, 1993
- Measuring properties of point defects by electron microscopy: The Ga vacancy in GaAsPhysical Review Letters, 1992
- Layer-by-layer sputtering and epitaxy of Si(100)Physical Review Letters, 1991
- Activation energy for surface diffusion of Si on Si(001): A scanning-tunneling-microscopy studyPhysical Review Letters, 1991
- Point defects, diffusion mechanisms, and superlattice disordering in gallium arsenide-based materialsCritical Reviews in Solid State and Materials Sciences, 1991