Moisture, Myths, and Microcircuits
- 1 September 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Parts, Hybrids, and Packaging
- Vol. 12 (3) , 167-171
- https://doi.org/10.1109/tphp.1976.1135142
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Migrated-Gold Resistive Shorts in Microcircuits8th Reliability Physics Symposium, 1975
- Miniature Moisture Sensors for In-Package Use by the Microelectronics Industry8th Reliability Physics Symposium, 1975
- Reliability engineeringMicroelectronics Reliability, 1968
- The Effect of Cleanliness on Integrated Circuit ReliabilityFourth Annual Symposium on the Physics of Failure in Electronics, 1967
- Factors Affecting the Reliability of Wet Tantalum CapacitorsFourth Annual Symposium on the Physics of Failure in Electronics, 1967
- Properties of Plastic Materials and How They Relate to Device Failure MechanismsFourth Annual Symposium on the Physics of Failure in Electronics, 1965