Reliability engineering
- 1 February 1968
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 7 (1) , 91-103
- https://doi.org/10.1016/0026-2714(68)90007-3
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Failure mechanisms in silicon transistors deduced from step stress testsMicroelectronics Reliability, 1966
- Effect of collector voltage and collector current on junction temperatureElectronics Letters, 1965
- Expanded contacts and interconnexions to monolithic silicon integrated circuitsSolid-State Electronics, 1965
- An investigation into the reliability of planar transistorsMicroelectronics Reliability, 1965
- The Step Stress method of accelerated life testingMicroelectronics Reliability, 1963
- Gettering of Metallic Impurities from Planar Silicon DiodesJournal of the Electrochemical Society, 1963
- Metal Precipitates in Silicon p-n JunctionsJournal of Applied Physics, 1960