Failure mechanisms in silicon transistors deduced from step stress tests

This publication has 4 references indexed in Scilit:

• Expanded contacts and interconnexions to monolithic silicon integrated circuits
  Solid-State Electronics, 1965
• An investigation into the reliability of planar transistors
  Microelectronics Reliability, 1965
• The Step Stress method of accelerated life testing
  Microelectronics Reliability, 1963
• Diffusion in evaporated films of gold-aluminium
  Philosophical Magazine, 1962