New matrix effect in ion-excited x-ray elemental analysis
- 1 May 1976
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 28 (9) , 497-499
- https://doi.org/10.1063/1.88830
Abstract
Pure Al and Al0.5Ti0.5 targets were bombarded by Ar ions in the energy range 100 keV–3 MeV. For Ar energies between 260 keV and 1.25 MeV, it was found that the Al‐Ti target is a more intense emitter of Al K x rays than is the pure Al target. These findings are consistent with the predictions of a two‐step process in which Ar L‐shell vacancies produced in an Ar‐Ti collision are transferred to the K shell of an Al atom in a second collision.Keywords
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