Electric field effect on the thermal emission of traps in semiconductor junctions
- 1 August 1979
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 50 (8) , 5484-5487
- https://doi.org/10.1063/1.326601
Abstract
Electric field effects on the thermal emission of traps in a diode have been studied. Calculations were performed and compared with experimental data on deep centers in GaAs. The results are consistent with a thermal equivalent of the optical Franz‐Keldysh effect.This publication has 14 references indexed in Scilit:
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