Electron and hole trapping in irradiated SIMOX, ZMR and BESOI buried oxides
- 1 December 1992
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 39 (6) , 2086-2097
- https://doi.org/10.1109/23.211407
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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