A forward scattering technique for the determination of target thickness
- 1 March 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 22 (1) , 87-90
- https://doi.org/10.1016/0168-583x(87)90300-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Hydrogen profiling by proton-proton scatteringNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Use of rutherford scattering on a secondary carbon target for correcting intermediate thickness sample PIXE measurementsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Precision of PIXE analysis of thin fluid-residue specimens using internal standardsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Non-destructive measurement of hydrogen in thin sheet materialsNuclear Instruments and Methods, 1974