X-ray spectroscopic study of the electronic structure of amorphous SiNx:H (0.04 ≲ x ≲ 0.44)
- 1 December 1987
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 97-98, 843-846
- https://doi.org/10.1016/0022-3093(87)90202-x
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Electronic structure of hydrogenated and unhydrogenated amorphous: A photoemission studyPhysical Review B, 1984
- Electrical properties of glow discharge amorphous SiNx: H thin filmsThin Solid Films, 1983