X-ray total external reflectance–diffraction as a probe of the structure of the liquid–vapor interface
- 1 September 1983
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 79 (5) , 2482-2486
- https://doi.org/10.1063/1.446058
Abstract
For potential use in the study of the structure of the liquid–vapor interface of a liquid metal, we analyze the scattering of a collimated beam of x rays which strike the plane surface of a liquid metal at an angle below the range for total external reflection. Our analysis of the diffraction pattern is based on the Von Laue model of a condensed phase scatterer and the distorted wave approximation. The x‐ray total reflectance–diffraction is expressed in terms of the structure factor of the inhomogeneous transition zone between the liquid and vapor of a metal.Keywords
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