Future prospects for Si CMOS technology

This publication has 6 references indexed in Scilit:

• Monte Carlo modeling of threshold variation due to dopant fluctuations
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
• Reliability projection for ultra-thin oxides at low voltage
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• 25 nm CMOS design considerations
  Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
• Nanoscale CMOS
  Proceedings of the IEEE, 1999
• Generalized scale length for two-dimensional effects in MOSFETs
  IEEE Electron Device Letters, 1998
• Hot Carrier Design Considerations for MOS Devices and Circuits
  Published by Springer Nature ,1992