Application of focused ion beam milling to cross-sectional TEM specimen preparation of industrial materials including heterointerfaces
- 1 April 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 319 (1-2) , 92-96
- https://doi.org/10.1016/s0040-6090(97)01093-6
Abstract
No abstract availableKeywords
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