Reflection extended x-ray absorption fine structure recorded using a laser-produced plasma x-ray source
- 1 September 1985
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 47 (5) , 442-444
- https://doi.org/10.1063/1.96140
Abstract
This letter describes the first use of a laser plasma x-ray source for the recording of surface reflection EXAFS (extended x-ray absorption fine structure), or reflexafs. A powerful technique in which a subnanosecond pulse of x rays is used to record the reflection spectrum over a range of incidence angles and wavelengths in a single shot is described. Reflexafs spectra for aluminum are presented which compare favorably with spectra recorded in transmission mode.Keywords
This publication has 11 references indexed in Scilit:
- Improved laser-EXAFS studies of aluminium foilJournal of Physics C: Solid State Physics, 1984
- A Fast X-Ray Absorption Spectrometer for Use with Synchrotron RadiationJapanese Journal of Applied Physics, 1981
- The extended X-ray absorption fine structure in the reflectivity at the K edge of CuJournal of Physics C: Solid State Physics, 1981
- Fast extended—x-ray-absorption—fine-structure spectroscopy with a laser-produced x-ray pulsePhysical Review A, 1981
- Laser-EXAFS: Fast Extended X-ray Absorption Fine Structure Spectroscopy with a Single Pulse of Laser-Produced X-raysScience, 1979
- X-ray photoabsorption of solids by specular reflectionJournal of Physics C: Solid State Physics, 1978
- Synchrotron Radiation Studies of the -Edge Photoabsorption Spectra of Kr, , and Ge: A Comparison of Theory and ExperimentPhysical Review Letters, 1975
- Theory of the extended x-ray absorption fine structurePhysical Review B, 1975
- Surface Studies of Solids by Total Reflection of X-RaysPhysical Review B, 1954
- Zur Dispersionstheorie der RöntgenstrahlenThe European Physical Journal A, 1933