Semiconductor and semi-insulator resistivity measurements using a direct current four point probe apparatus with non-penetrating tips
- 30 April 1973
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 16 (4) , 503-506
- https://doi.org/10.1016/0038-1101(73)90189-5
Abstract
No abstract availableKeywords
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