Hard x-ray microprobe with total-reflection mirrors
- 1 January 1992
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (1) , 578-581
- https://doi.org/10.1063/1.1142710
Abstract
A hard x‐ray microprobe with a grazing‐incidence total‐reflection mirror system is developed. The optical system has a pair of elliptical mirrors arranged in a crossed mirror geometry (Kirkpatrick–Baez configuration) and forms demagnified images of an x‐ray source. A focused spot size of 3.5 μm×4.8 μm is obtained at a wavelength of 2.3 Å. A focusing test with an x‐ray source determined by a pinhole generates a finer microbeam. Preliminary experiments on scanning x‐ray microscopy are performed using the focused x‐ray beam.Keywords
This publication has 12 references indexed in Scilit:
- Fabrication of aspheric mirrors for a hard X-ray microprobe.Journal of the Japan Society for Precision Engineering, 1991
- Ellipsoid X-ray focussing for synchrotron-radiation microprobe analysis at the SRS, Daresbury, UKNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- A tunable X-ray microprobe using synchrotron radiationNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1990
- X-Ray Microprobe with a Pair of Elliptical MirrorsJapanese Journal of Applied Physics, 1989
- Development of a scanning x-ray microprobe with synchrotron radiationReview of Scientific Instruments, 1989
- X-ray microprobe using multilayer mirrorsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- X-Ray Sensing Pickup TubeJapanese Journal of Applied Physics, 1988
- A Soft X-Ray Microprobe Using an Axisymmetric Tandem Toroidal MirrorJapanese Journal of Applied Physics, 1987
- Elemental and chemical-state imaging using synchrotron radiationApplied Optics, 1986
- Formation of Optical Images by X-RaysJournal of the Optical Society of America, 1948