X-ray diffraction study of corrugated semiconductor surfaces, quantum wires and quantum ☐es
- 1 January 1992
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 60-61, 517-521
- https://doi.org/10.1016/0169-4332(92)90469-e
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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