Measurements of the channel-conductivity of Si-rectifiers

Publisher Website

1 February 1965

journal article
Published by Elsevier in Solid-State Electronics

Vol. 8 (2) , 103-108
https://doi.org/10.1016/0038-1101(65)90040-7

Abstract

No abstract available

Keywords

This publication has 7 references indexed in Scilit:

Scheinwiderstand und Sperrkennlinien von Silizium-p-n-Übergängen mit Oberflächeninversionsschicht
Solid-State Electronics, 1962
Sperrkennlinien mit Oberflächendurchbruch von Silicium-p s_p n-Gleichrichtern
Zeitschrift für Naturforschung A, 1960
Inversionsrandschichten auf p-Silicium
Zeitschrift für Naturforschung A, 1957
Surface States on Silicon and Germanium Surfaces
Physical Review B, 1956
Water-Vapor-Induced $n$ -Type Surface Conductivity on $p$ -Type Germanium
Physical Review B, 1955
Measurement and Interpretation of Conductance of $P$ -Type Inversion Layers on Germanium
Physical Review B, 1955
Water Vapor and the "Channel" Effect in $n - p - n$ Junction Transistors
Physical Review B, 1954