MBE growth of quantum-size Si-dots on SiC(0001) monitored by RHEED
- 1 April 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 318 (1-2) , 88-92
- https://doi.org/10.1016/s0040-6090(97)01145-0
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Self-assembled island formation in heteroepitaxial growthApplied Physics Letters, 1997
- Resonant tunneling through a self-assembled Si quantum dotApplied Physics Letters, 1997
- Optical monitoring of the development of InAs quantum dots on GaAs(001) by reflectance anisotropy spectroscopyJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1996
- SiC(0001)3 × 3-Si surface reconstruction — a new insight with a STMSurface Science, 1996
- Concepts in Surface PhysicsPublished by Springer Nature ,1993
- In situ probing at the growth temperature of the surface composition of (InGa)As and (InAl)AsApplied Physics Letters, 1992
- Kinetically controlled critical thickness for coherent islanding and thick highly strained pseudomorphic films of As on GaAs(100)Physical Review B, 1992
- Surface Diffusion Coefficients on Stranski-Krastanov LayersJapanese Journal of Applied Physics, 1990
- FestkörperphysikPublished by Springer Nature ,1990
- Adsorption, potential maps and diffusion of Si, C, and SiC on A Si(111) surfaceSurface Science, 1985