Generalized ellipsometric method for the determination of all the optical constants of the system: Optically absorbing film on an absorbing substrate
- 1 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 49-63
- https://doi.org/10.1016/0039-6028(76)90433-7
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*Journal of the Optical Society of America, 1975
- Algorithm 419: zeros of a complex polynomial [C2]Communications of the ACM, 1972
- Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*Journal of the Optical Society of America, 1972
- Geometrically Exact Ellipsometer AlignmentApplied Optics, 1971
- Definitions and conventions in ellipsometrySurface Science, 1969