Aliasing-free signature analysis for RAM BIST
- 1 January 1994
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 368-377
- https://doi.org/10.1109/test.1994.527978
Abstract
ISBN: 0780321022Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BISTKeywords
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