Materials Characterization of Nondestructive Readout Nonvolatile Memory Devices
- 1 January 1993
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Patent scanBiosensors and Bioelectronics, 1991
- Pulsed laser deposition and ferroelectric characterization of bismuth titanate filmsApplied Physics Letters, 1991
- Preparation of Pb(Zr,Ti)O3 thin films by sol gel processing: Electrical, optical, and electro-optic propertiesJournal of Applied Physics, 1988
- Electronic Ceramic Thin Films: Trends in Research and DevelopmentMRS Bulletin, 1987
- Fundamentals of Secondary Ion Mass SpectrometryMRS Bulletin, 1987
- Ferroelectwc-semiconductor devicesFerroelectrics, 1978
- Ferroelectric field effect studies at low temperaturesFerroelectrics, 1970
- Effect of ferroelectric polarization on insulated-gate thin-film transistor parametersSolid-State Electronics, 1966