Soft x-ray emission studies of the bulk electronic structure of AlN, GaN, and Al0.5Ga0.5N
- 1 July 1998
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 16 (4) , 2250-2253
- https://doi.org/10.1116/1.590157
Abstract
No abstract availableKeywords
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