Deposition and characterization of TiNi-base thin films by sputtering
- 31 January 2000
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 277 (1-2) , 11-17
- https://doi.org/10.1016/s0921-5093(99)00560-2
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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