Total reflection X-ray fluorescence analysis with polarized X-rays, a compact attachment unit, and high energy X-rays
- 1 January 1989
- journal article
- research article
- Published by Elsevier in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 44 (5) , 453-460
- https://doi.org/10.1016/0584-8547(89)80050-3
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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