Ray Tracing of a Concave-Curved-Crystal Spectrometer and Its Detailed Characteristics for X-Ray Spectroscopic Diagnostics of High-Temperature Plasmas

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Abstract
A method of ray tracing is presented for a spectrometer with a concave-curved crystal to be used for X-ray spectroscopic diagnostics of high-temperature plasmas. Calculations have been carried out for an LiF(200) crystal with a lowland circle of radius 50 cm and a Gaussian rocking curve. With a linear X-ray source, the most suitable parameters of the spectrometer were accurately determined by use of the ray tracing, and the characteristics were investigated in detail. The ray tracing was also applied to a point source of X-rays, and the best conditions for geometric relations between the point source and the spectrometer were found. The spectral distortion is also described here analytically. The calculated line profile including the natural broadening of the X-ray source is compared with the experimental result for FeKα1. Good agreement is obtained.