A new method for a great reduction of dislocation density in a GaN layer grown on a sapphire substrate
- 18 May 2000
- journal article
- research article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 213 (1-2) , 188-192
- https://doi.org/10.1016/s0022-0248(00)00373-0
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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