Dynamic aspects of scanning surface instruments and microscopes
- 1 July 1990
- journal article
- Published by IOP Publishing in Nanotechnology
- Vol. 1 (1) , 93-102
- https://doi.org/10.1088/0957-4484/1/1/014
Abstract
Recent advances in surface scanning microscopes (STM, AFM) and nanometre topographic instruments warrant a new look at the criteria of performance required and how to achieve them. In this paper the basic system is examined with particular emphasis being placed on the role of damping in the mechanical system. Two concepts are introduced, integrated damping and differential spatial damping. Also, the use of scanning velocity to couple the instrument and surface coordinate systems is demonstrated.Keywords
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- Scanning tunneling microscopySurface Science, 1985