Low dark current infrared hot-electron transistor for 77 K operation

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Abstract
Recently, thermal imaging using quantum well infrared photodetector (QWIP) focal plane arrays has been demonstrated. However, the operating temperature needs to be kept around 60 K due to the large dark current occurring at higher temperatures. In order to achieve thermal imaging at 77 K, we have designed and demonstrated two infrared hot‐electron transistor structures, whose dark current is two to three orders of magnitude lower than that of a QWIP. The resultant dark current falls within the limit of the charge handling capacity of a readout circuit, and the infrared detection is demonstrated to be background limited at 77 K. The noise equivalent temperature difference of the detectors is estimated to be 14 and 26 mK, respectively.